Elenco pubblicazioni 2014-2018

Nitric oxide assisted C60-SIMS for molecular depth profiling of polyelectrolyte multilayers

G.Zappalà, N.Tuccitto, S.Vitale, A.Torrisi, A.Licciardello

Rapid Communication in Mass Spectrometry, 29 (2015) 2204–2210

 

A wavelet-PCA method saves high mass resolution information in data treatment of SIMS

       molecular depth profiles  

N.Tuccitto, G.Zappalà, S.Vitale, A.Torrisi, A.Licciardello

Surface and Interface Analysis, vol. 48 (2016), 317-327, ISSN: 0142-2421, doi: 10.1002/sia5943

 

SIMS characterisation of surface-modified nanostructured titania electrodes for solar

      energy conversion devices

S.Vitale, G.Zappalà, N.Tuccitto, A.Torrisi, E.Napolitani, A.Licciardello

Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 34, 03H110 (2016), ISSN: 2166-2746, doi: 10.1116/1.4941428

 

Transport and Reaction Model for Simulating Cluster SIMS Depth Profiles of Organic

       Solids

N. Tuccitto, G.Zappalà, S.Vitale, A.Torrisi, A. Licciardello

Journal of Physical Chemistry. C, Nanomaterials and Interfaces, vol. 120 (2016), 9263-9269, ISSN: 1932-7447, doi: 10.1021/acs.jpcc.6b01532.

 

Unsupervised analysis of big ToF-SIMS datasets: a statistical pattern recognition approach

N. Tuccitto, G.Capizzi, A.Torrisi, A. Licciardello

Analytical Chemistry, 2018, DOI: 10.1021/acs.analchem.7b05003.

 

The effect of sputtering yield changes on the depth resolution in cluster beam depth-profiling of polymers

N. Tuccitto, A.Bombace, A.Torrisi, A. Licciardello

Journal of Vacuum Science and Technology. B, 2018, DOI.org/10.1116/1.5019698